cpm-038
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Unit : mm
CPM-038B1B1-12.2L

| Materials and finishes | ||
| Plunger-Top | 頭針 | SK4 / Au Plated | 
| Plunger-Bottom | 尾針 | SK4 / Au Plated | 
| Barrel | 針管 | P.B. / Au Plated | 
| Spring | 彈簧 | SUS / Au Plated | 
| Mechanical | ||
| Spring Force | 彈力 | 36grams @1.0mm | 
| Full Travel | 最大行程 | 2.0mm | 
| Recommend Travel | 建議行程 | 1.0mm | 
| Mechanical Life | 使用壽命 | 200K | 
| Bandwidth | 頻寬 | -0.259dB@20GHz | 
| Electrical | ||
| Current Rating | 額定電流 | 2A | 
| Contact Resistance | 接觸電阻 | <100mΩ | 


Unit : mm
CPM-038BF-5.7L

| Materials and finishes | ||
| Plunger-Top | 頭針 | BeCu / Au Plated | 
| Plunger-Bottom | 尾針 | BeCu / Au Plated | 
| Barrel | 針管 | P.B. / Au Plated | 
| Spring | 彈簧 | Music Wire / Au Plated | 
| Mechanical | ||
| Spring Force | 彈力 | 20grams @0.65mm | 
| Full Travel | 最大行程 | 1.0mm | 
| Recommend Travel | 建議行程 | 0.65mm | 
| Mechanical Life | 使用壽命 | 200K | 
| Bandwidth | 頻寬 | -0.53dB@20GHz | 
| Electrical | ||
| Current Rating | 額定電流 | 1A | 
| Contact Resistance | 接觸電阻 | <100mΩ | 


Unit : mm
CPM-038BF-8.85L

| Materials and finishes | ||
| Plunger-Top | 頭針 | BeCu / Au Plated | 
| Plunger-Bottom | 尾針 | BeCu / Au Plated | 
| Barrel | 針管 | P.B. / Au Plated | 
| Spring | 彈簧 | Music Wire / Au Plated | 
| Mechanical | ||
| Spring Force | 彈力 | 23grams @0.7mm | 
| Full Travel | 最大行程 | 2.0mm | 
| Recommend Travel | 建議行程 | 0.7mm | 
| Mechanical Life | 使用壽命 | 200K | 
| Bandwidth | 頻寬 | -0.255dB@20GHz | 
| Electrical | ||
| Current Rating | 額定電流 | 1A | 
| Contact Resistance | 接觸電阻 | <100mΩ | 


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	CPM-038B1B1-12.2L The CPM-038B1B1-12.2L semiconductor test probe is designed for precision testing in demanding applications. It features SK4 gold-plated plungers, a P.B. gold-plated barrel, and a SUS gold-plated spring. With a spring force of 36 grams at 1.0mm, it provides robust contact for accurate measurements. The probe offers a full travel of 2.0mm, with a recommended travel of 1.0mm. With a mechanical life of 200K cycles, it ensures reliable and long-lasting performance. The probe boasts a bandwidth of -0.259dB at 20GHz, making it suitable for high-frequency applications. The electrical specifications include a current rating of 2A and contact resistance below 100mΩ. 
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	CPM-038BF-5.7L The CPM-038BF-5.7L test probe model is designed with BeCu gold-plated plungers, a P.B. gold-plated barrel, and a Music Wire gold-plated spring. It exerts a spring force of 20 grams at 0.65mm, ensuring precise and reliable contact. The probe offers a full travel of 1.0mm, with a recommended travel of 0.65mm. With a mechanical life of 200K cycles, it guarantees durability and longevity. The probe exhibits a bandwidth of -0.53dB at 20GHz, making it suitable for high-frequency testing. The electrical specifications include a current rating of 1A and contact resistance below 100mΩ. 
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	CPM-038BF-8.85L The CPM-038BF-8.85L test probe features BeCu gold-plated plungers, a P.B. gold-plated barrel, and a Music Wire gold-plated spring. It exerts a spring force of 23 grams at 0.7mm, providing reliable contact for accurate measurements. The probe offers a full travel of 2.0mm, with a recommended travel of 0.7mm. With a mechanical life of 200K cycles, it ensures consistent performance and longevity. The probe boasts a bandwidth of -0.255dB at 20GHz, suitable for high-frequency applications. The electrical specifications include a current rating of 1A and contact resistance below 100mΩ. 
