CPM-058

CPM-058

MODEL:CPM-058
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SPECIFICATION

Unit : mm

CPM-058BF-3.1L

 

Materials and finishes
Plunger-Top BeCu / Au Plated
Plunger-Bottom BeCu / Au Plated
Barrel P.B. / Au Plated
Spring Music Wire / Au Plated

Mechanical
Spring Force 52grams @0.5mm
Full Travel 0.6mm
Recommend Travel 0.5mm
Mechanical Life 200K
Bandwidth -0.082dB@20GHz

Electrical
Current Rating 2A
Contact Resistance <100mΩ

 

 

 

 

 


Unit : mm

CPM-058BF-3.38L

 

Materials and finishes
Plunger-Top BeCu / Au Plated
Plunger-Bottom BeCu / Au Plated
Barrel P.B. / Au Plated
Spring SUS / Music Wire / Au Plated

Mechanical
Spring Force 30grams @0.5mm
Full Travel 0.7mm
Recommend Travel 0.5mm
Mechanical Life 500K
Bandwidth -0.381dB@20GHz

Electrical
Current Rating 2A
Contact Resistance <100mΩ

 

 

 

 

 


Unit : mm

CPM-058BF-4.9L

 

Materials and finishes
Plunger-Top BeCu / Au Plated
Plunger-Bottom BeCu / Au Plated
Barrel P.B. / Au Plated
Spring Music Wire / Au Plated

Mechanical
Spring Force 30grams @0.65mm
Full Travel 0.8mm
Recommend Travel 0.65mm
Mechanical Life 500K
Bandwidth -0.118dB@20GHz

Electrical
Current Rating 2A
Contact Resistance <100mΩ

 

 

 

 

 


Unit : mm

CPM-058BF-5.8L

 

Materials and finishes
Plunger-Top BeCu / Sk4 / Au Plated
Plunger-Bottom BeCu / Au Plated
Barrel P.B. / Au Plated
Spring Music Wire / Au Plated

Mechanical
Spring Force 28grams @0.65mm
Full Travel 1.0mm
Recommend Travel 0.65mm
Mechanical Life 500K
Bandwidth -0.299dB@20GHz

Electrical
Current Rating 2A
Contact Resistance <100mΩ

 

 

 

 

  1. CPM-058BF-3.1L The CPM-058BF-3.1L semiconductor test probe is a high-performance tool designed for precise testing in the semiconductor industry. It features BeCu gold-plated plungers, a P.B. gold-plated barrel, and a Music Wire gold-plated spring. With a spring force of 52 grams at 0.5mm, this probe ensures strong and reliable contact. It offers a full travel of 0.6mm, with a recommended travel of 0.5mm, making it suitable for precise measurements. With a mechanical life of 200K cycles, it guarantees durability and longevity. The probe exhibits a bandwidth of -0.082dB at 20GHz, ensuring accurate signal transmission. The electrical specifications include a current rating of 2A and contact resistance below 100mΩ.

  2. CPM-058BF-3.38L The CPM-058BF-3.38L semiconductor test probe is a reliable tool designed for demanding testing applications. It features BeCu gold-plated plungers, a P.B. gold-plated barrel, and a SUS/Music Wire gold-plated spring. With a spring force of 30 grams at 0.5mm, it provides consistent contact for accurate measurements. The probe offers a full travel of 0.7mm, with a recommended travel of 0.5mm, ensuring precise testing capabilities. With an extended mechanical life of 500K cycles, it guarantees longevity and reliability. The probe exhibits a bandwidth of -0.381dB at 20GHz, suitable for high-frequency testing. The electrical specifications include a current rating of 2A and contact resistance below 100mΩ.

  3. CPM-058BF-4.9L The CPM-058BF-4.9L semiconductor test probe is a versatile tool designed for efficient testing in the semiconductor industry. It features BeCu gold-plated plungers, a P.B. gold-plated barrel, and a Music Wire gold-plated spring. With a spring force of 30 grams at 0.65mm, it ensures reliable and accurate contact. The probe offers a full travel of 0.8mm, with a recommended travel of 0.65mm, providing flexibility in testing setups. With an extended mechanical life of 500K cycles, it offers long-lasting performance. The probe exhibits a bandwidth of -0.118dB at 20GHz, suitable for high-frequency applications. The electrical specifications include a current rating of 2A and contact resistance below 100mΩ.

  4. CPM-058BF-5.8L The CPM-058BF-5.8L semiconductor test probe is an excellent choice for precise testing requirements. It features BeCu/Sk4 gold-plated plungers, a P.B. gold-plated barrel, and a Music Wire gold-plated spring. With a spring force of 28 grams at 0.65mm, it ensures reliable and accurate contact for testing purposes. The probe offers a full travel of 1.0mm, with a recommended travel of 0.65mm, providing flexibility in testing setups. With an extended mechanical life of 500K cycles, it guarantees durability and longevity. The probe exhibits a bandwidth of -0.299dB at 20GHz, making it suitable for high-frequency testing. The electrical specifications include a current rating of 2A and contact resistance below 100mΩ.

 

 

 


SPECIFICATION

Unit : mm

CPM-058BF-6.3L

 

Materials and finishes
Plunger-Top 頭針 BeCu / Sk4 / Au Plated
Plunger-Bottom 尾針 BeCu / Au Plated
Barrel 針管 P.B. / Au Plated
Spring 彈簧 Music Wire / Au Plated

Mechanical
Spring Force 彈力 28grams @0.65mm
Full Travel 最大行程 1.0mm
Recommend Travel 建議行程 0.65mm
Mechanical Life 使用壽命 500K
Bandwidth 頻寬 -0.308dB@20GHz

Electrical
Current Rating 額定電流 2A
Contact Resistance 接觸電阻 <100mΩ

 

 

 

 

 


Unit : mm

CPM-058BF-8.65L

 

Materials and finishes
Plunger-Top 頭針 BeCu / Au Plated
Plunger-Bottom 尾針 BeCu / Au Plated
Barrel 針管 P.B. / Au Plated
Spring 彈簧 Music Wire / Au Plated

Mechanical
Spring Force 彈力 35grams @0.8mm
Full Travel 最大行程 1.2mm
Recommend Travel 建議行程 0.8mm
Mechanical Life 使用壽命 500K
Bandwidth 頻寬 -0.145dB@20GHz

Electrical
Current Rating 額定電流 2A
Contact Resistance 接觸電阻 <100mΩ

 

 

 

 

 


Unit : mm

CPM-058BF-8.85L

 

Materials and finishes
Plunger-Top 頭針 BeCu / Au Plated
Plunger-Bottom 尾針 BeCu / Au Plated
Barrel 針管 P.B. / Au Plated
Spring 彈簧 Music Wire / Au Plated

Mechanical
Spring Force 彈力 35grams @0.8mm
Full Travel 最大行程 1.2mm
Recommend Travel 建議行程 0.8mm
Mechanical Life 使用壽命 500K
Bandwidth 頻寬 -0.253dB@20GHz

Electrical
Current Rating 額定電流 2A
Contact Resistance 接觸電阻 <100mΩ

 

 

 

 

 


Unit : mm

CPM-058FF-11.3L

 

Materials and finishes
Plunger-Top 頭針 BeCu / Au Plated
Plunger-Bottom 尾針 BeCu / Au Plated
Barrel 針管 P.B. / Au Plated
Spring 彈簧 SUS / Au Plated

Mechanical
Spring Force 彈力 75grams @2.0mm
Full Travel 最大行程 2.2mm
Recommend Travel 建議行程 2.0mm
Mechanical Life 使用壽命 500K
Bandwidth 頻寬 -0.194dB@20GHz

Electrical
Current Rating 額定電流 1A
Contact Resistance 接觸電阻 <100mΩ

 

 

 

 

 


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