cpm-011

Unit : mm

The probe consists of different components with specific materials and finishes. The top and bottom plungers are made of Pd Alloy, which provides excellent conductivity and corrosion resistance. The barrel is made of P.B. (Phosphor Bronze) and is Au (Gold) plated, enhancing its electrical conductivity and providing resistance to oxidation. The spring is made of Music Wire and is also Au plated, ensuring reliable spring action and resistance to corrosion.

In terms of mechanical specifications, the probe has a spring force of 4 grams at 0.35mm. This force ensures proper contact with the semiconductor device under test, allowing for accurate and consistent measurements. The full travel distance of the probe is 0.5mm, indicating the maximum distance the probe can move during testing. The recommended travel distance is 0.35mm, which suggests the ideal operating range for optimal performance.

The probe has a mechanical life of 50K, meaning it is designed to withstand repeated use over a significant number of testing cycles. This durability ensures the longevity of the probe and its reliable performance throughout its lifespan.

In terms of electrical specifications, the probe has a current rating of 0.3A, indicating the maximum current it can handle without compromising its performance. The contact resistance of the probe is specified to be less than 200mΩ, ensuring minimal resistance and accurate electrical measurements.

The probe also demonstrates excellent performance in terms of bandwidth, with a measured -1.024dB attenuation at 2.88GHz. This characteristic indicates the probe's ability to maintain signal integrity and preserve the accuracy of high-frequency measurements.